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Domain structure and perpendicular magnetic anisotropy in CoFe/Pd multilayers using off-axis electron holography

机译:CoFe / pd中的畴结构和垂直磁各向异性   使用离轴电子全息术的多层膜

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摘要

Multilayers of Co90Fe10/Pd with different bilayer thicknesses, have beendeposited by dc-magnetron sputtering on thermally oxidized Si wafers.Transmission electron microscopy showed that the highly textured crystallinefilms had columnar structure, while scanning transmission electron microscopyand atomic force microscopy respectively indicated some layer waviness andsurface roughness. The magnetic domain structure and perpendicular magneticanisotropy (PMA) of the Co90Fe10/Pd multilayers were investigated by off-axiselectron holography and magnetic force microscopy. The Co90Fe10 layer thicknesswas the primary factor determining the magnetic domain size and theperpendicular magnetization: both decreased as the thickness increased. Thestrongest PMA was observed in the sample with the thinnest magnetic layer of0.45 nm.
机译:直流磁控溅射法在热氧化的硅片上沉积了具有不同双层厚度的Co90Fe10 / Pd多层膜。透射电子显微镜显示高度织构的结晶膜具有柱状结构,而扫描透射电子显微镜和原子力显微镜则分别显示了某些层的波纹度和表面粗糙度。通过离轴电子全息和磁力显微镜研究了Co90Fe10 / Pd多层膜的磁畴结构和垂直磁各向异性(PMA)。 Co90Fe10层的厚度是决定磁畴尺寸和垂直磁化强度的主要因素:两者均随厚度增加而减小。在具有最薄磁性层为0.45 nm的样品中观察到最强的PMA。

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